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dc.contributor.authorKILINÇ, SEDAT
dc.contributor.authorYarman, Binboga Siddik
dc.date.accessioned2023-10-10T10:55:11Z
dc.date.available2023-10-10T10:55:11Z
dc.identifier.citationYarman B. S., KILINÇ S., "A New Real Frequency Line Segment Technique to Assess the Gain Bandwidth Limitations for the Double Matching Problems", International Microwave and Antenna Symposium (IMAS), Cairo, Mısır, 7 - 09 Şubat 2023, ss.111-114
dc.identifier.otherav_0f76a9ea-2ed3-4f55-b02c-049a625b4be3
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/189596
dc.identifier.urihttps://doi.org/10.1109/imas55807.2023.10066921
dc.description.abstractIn this paper, we introduced a new real frequency line segment technique (RF-LST) to assess the gain bandwidth limitation of double matching problems. The new method possesses all the outstanding features of the classical RF-LST, and it is the only practical tool available in the current literature to assess the gain-bandwidth limitations of double matching problems numerically. An example is presented to show the application of the newly proposed method. It is expected that the newly proposed RF-LST technique will be useful to assess the power and efficiency performance of interstage matching networks in designing single or multistage microwave amplifiers and communication systems such as transmitters, receivers phase array antenna systems, Electronic Warfare systems etc.
dc.language.isoeng
dc.subjectMÜHENDİSLİK, ELEKTRİK VE ELEKTRONİK
dc.subjectMühendislik
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectTELEKOMÜNİKASYON
dc.subjectBilgi Sistemleri, Haberleşme ve Kontrol Mühendisliği
dc.subjectSinyal İşleme
dc.subjectFizik Bilimleri
dc.subjectBilgisayar Ağları ve İletişim
dc.subjectMühendislik (çeşitli)
dc.subjectElektrik ve Elektronik Mühendisliği
dc.subjectGenel Mühendislik
dc.subjectMühendislik ve Teknoloji
dc.titleA New Real Frequency Line Segment Technique to Assess the Gain Bandwidth Limitations for the Double Matching Problems
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , ,
dc.contributor.firstauthorID4314331


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