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The thickness dependence of electrical properties of Bi thin films”, “Nonlinear Homogenization and its Application to Composites, Polycrystals and Smart Materials”, Polonya, 23-26 Haziran 2003.

dc.contributor.authorUlutaş, Hulusı Kemal
dc.contributor.authorDeğer , Denız
dc.date.accessioned2021-03-05T14:34:10Z
dc.date.available2021-03-05T14:34:10Z
dc.identifier.citationUlutaş H. K. , Değer D., "The thickness dependence of electrical properties of Bi thin films”, “Nonlinear Homogenization and its Application to Composites, Polycrystals and Smart Materials”, Polonya, 23-26 Haziran 2003.", Nonlinear Homogenization and its Application to Composites, Polycrystals and Smart Materials, Krakow, Polonya, 1 - 04 Haziran 2003, ss.10
dc.identifier.otherav_b7d217c2-b692-46a8-bc5f-d86d870a3465
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/122320
dc.language.isoeng
dc.subjectMühendislik ve Teknoloji
dc.subjectMETALURJİ VE METALURJİ MÜHENDİSLİĞİ
dc.subjectMetalurji ve Malzeme Mühendisliği
dc.subjectMalzeme Bilimi
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.titleThe thickness dependence of electrical properties of Bi thin films”, “Nonlinear Homogenization and its Application to Composites, Polycrystals and Smart Materials”, Polonya, 23-26 Haziran 2003.
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.contributor.firstauthorID732703


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