| dc.contributor.author | Sezgin, Hatice Gui | |
| dc.contributor.author | Ozcelep, YASİN | |
| dc.date.accessioned | 2021-03-05T19:21:49Z | |
| dc.date.available | 2021-03-05T19:21:49Z | |
| dc.identifier.citation | Sezgin H. G. , Ozcelep Y., "Characterization and modeling of power MOSFET switching times variations under constant electrical stress", MICROELECTRONICS RELIABILITY, cilt.55, ss.492-497, 2015 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.other | vv_1032021 | |
| dc.identifier.other | av_cef05ffc-ebdb-4d98-9663-dfa396db94c7 | |
| dc.identifier.uri | http://hdl.handle.net/20.500.12627/136874 | |
| dc.identifier.uri | https://doi.org/10.1016/j.microrel.2015.01.002 | |
| dc.description.abstract | In this paper, we proposed a simple and accurate degraded power MOSFET model for digital applications. The model provides to determine the electrical stress induced changes in power MOSFET switching characteristics. To establish the degraded power MOSFET and stress induced changes in switching parameters relation we consider the on-state-resistance of the power MOSFET as a voltage controlled resistor. We implemented a voltage non-linearly dependent resistor model in Pspice. We compared the experimental and simulation results to explore the model capability. (C) 2015 Elsevier Ltd. All rights reserved. | |
| dc.language.iso | eng | |
| dc.subject | Bilgi Sistemleri, Haberleşme ve Kontrol Mühendisliği | |
| dc.subject | Sinyal İşleme | |
| dc.subject | Yoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler | |
| dc.subject | Yüzeyler ve arayüzeyler; İnce filmler ve nanosistemler | |
| dc.subject | Temel Bilimler | |
| dc.subject | Mühendislik ve Teknoloji | |
| dc.subject | Temel Bilimler (SCI) | |
| dc.subject | FİZİK, UYGULAMALI | |
| dc.subject | Fizik | |
| dc.subject | NANOBİLİM VE NANOTEKNOLOJİ | |
| dc.subject | Mühendislik, Bilişim ve Teknoloji (ENG) | |
| dc.subject | Mühendislik | |
| dc.subject | MÜHENDİSLİK, ELEKTRİK VE ELEKTRONİK | |
| dc.title | Characterization and modeling of power MOSFET switching times variations under constant electrical stress | |
| dc.type | Makale | |
| dc.relation.journal | MICROELECTRONICS RELIABILITY | |
| dc.contributor.department | Bartın Üniversitesi , , | |
| dc.identifier.volume | 55 | |
| dc.identifier.startpage | 492 | |
| dc.identifier.endpage | 497 | |
| dc.contributor.firstauthorID | 82261 | |
