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Thickness dependence of the dielectric properties of TlSbS2 thin films

dc.contributor.authorUlutaş, Hulusı Kemal
dc.contributor.authorDeğer , Denız
dc.contributor.authorParto, Murat
dc.date.accessioned2021-03-05T20:20:51Z
dc.date.available2021-03-05T20:20:51Z
dc.identifier.citationParto M., Değer D., Ulutaş H. K. , "Thickness dependence of the dielectric properties of TlSbS2 thin films", Fizika Azerbaijan Journal of Physics, cilt.16, ss.339-341, 2010
dc.identifier.otherav_d3c47cda-4e10-4a78-8275-27d6d854b722
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/139773
dc.language.isoeng
dc.subjectTemel Bilimler
dc.subjectFizik
dc.subjectÇOK DİSİPLİNLİ BİLİMLER
dc.subjectDoğa Bilimleri Genel
dc.subjectTemel Bilimler (SCI)
dc.titleThickness dependence of the dielectric properties of TlSbS2 thin films
dc.typeMakale
dc.relation.journalFizika Azerbaijan Journal of Physics
dc.contributor.departmentİstanbul Üniversitesi , ,
dc.identifier.volume16
dc.identifier.startpage339
dc.identifier.endpage341
dc.contributor.firstauthorID732173


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