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dc.contributor.authorAKALIN, Elif
dc.contributor.authorLewis, R.B.
dc.contributor.authorTiedje, T.
dc.contributor.authorEROL, Ayşe
dc.contributor.authorKARA, Kamuran
dc.contributor.authorArıkan, Çetin M.
dc.contributor.authorAslan, Metin
dc.date.accessioned2021-03-06T11:04:49Z
dc.date.available2021-03-06T11:04:49Z
dc.identifier.citationAKALIN E., EROL A., Arıkan Ç. M. , KARA K., Aslan M., Lewis R., Tiedje T., "An investigation of Bismuth-related effects on GaAsBi/GaAs epilayers", 5th International Workshop on Bismuth Containing Semiconductors, Cork, İrlanda, 21 - 23 Temmuz 2014, ss.1
dc.identifier.othervv_1032021
dc.identifier.otherav_ed659dfd-3a40-40ca-9f86-bcead41d1b28
dc.identifier.urihttp://hdl.handle.net/20.500.12627/155847
dc.language.isoeng
dc.subjectTemel Bilimler (SCI)
dc.subjectFizik
dc.subjectTemel Bilimler
dc.titleAn investigation of Bismuth-related effects on GaAsBi/GaAs epilayers
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , ,
dc.contributor.firstauthorID664228


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