| dc.contributor.author | Değer, Denız | |
| dc.contributor.author | Yakut, Şahin | |
| dc.contributor.author | Ulutaş, Hulusı Kemal | |
| dc.date.accessioned | 2021-03-06T19:51:28Z | |
| dc.date.available | 2021-03-06T19:51:28Z | |
| dc.identifier.citation | Ulutaş H. K. , Değer D., Yakut Ş., "Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films", 15 th International conference on thin films, Kyoto, Japonya, 1 - 04 Kasım 2011, ss.206 | |
| dc.identifier.other | av_f84990e3-e19a-4d17-8d06-baaf9c2d38ad | |
| dc.identifier.other | vv_1032021 | |
| dc.identifier.uri | http://hdl.handle.net/20.500.12627/162652 | |
| dc.language.iso | eng | |
| dc.subject | Temel Bilimler | |
| dc.subject | Fizik | |
| dc.subject | ÇOK DİSİPLİNLİ BİLİMLER | |
| dc.subject | Doğa Bilimleri Genel | |
| dc.subject | Temel Bilimler (SCI) | |
| dc.title | Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films | |
| dc.type | Bildiri | |
| dc.contributor.department | İstanbul Üniversitesi , Fen Fakültesi , Fizik | |
| dc.contributor.firstauthorID | 732584 | |
