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EEG-based index for engagement level monitoring during sustained attention

dc.contributor.authorBarbieri, Riccardo
dc.contributor.authorBianchi, Anna Maria
dc.contributor.authorSclocco, Roberta
dc.contributor.authorReni, Gianluigi
dc.contributor.authorZucca, Claudio
dc.contributor.authorCoelli, Stefania
dc.date.accessioned2022-02-18T09:14:12Z
dc.date.available2022-02-18T09:14:12Z
dc.identifier.citationCoelli S., Sclocco R., Barbieri R., Reni G., Zucca C., Bianchi A. M. , "EEG-based index for engagement level monitoring during sustained attention", 37th Annual International Conference of the IEEE-Engineering-in-Medicine-and-Biology-Society (EMBC), Milan, İtalya, 25 - 29 Ağustos 2015, ss.1512-1515
dc.identifier.othervv_1032021
dc.identifier.otherav_2780868a-4919-4fe2-8f5d-4fff55111cb1
dc.identifier.urihttp://hdl.handle.net/20.500.12627/176794
dc.description.abstractThis paper investigates the relation between mental engagement level and sustained attention in 9 healthy adults performing a Conners' "not-X" continuous performance test (CPT), while their electroencephalographic (EEG) activity was simultaneously acquired. Spectral powers were estimated and extracted in the classical EEG frequency bands. The engagement index (beta/alpha) was calculated employing four different cortical montages suggested by the literature.
dc.language.isoeng
dc.subjectSinyal İşleme
dc.subjectBiyomedikal Mühendisliği
dc.subjectMühendislik ve Teknoloji
dc.subjectSignal Processing
dc.subjectGeneral Engineering
dc.subjectEngineering (miscellaneous)
dc.subjectBiomedical Engineering
dc.subjectElectrical and Electronic Engineering
dc.subjectMÜHENDİSLİK, ELEKTRİK VE ELEKTRONİK
dc.subjectPhysical Sciences
dc.subjectBioengineering
dc.subjectBilgi Sistemleri, Haberleşme ve Kontrol Mühendisliği
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectMühendislik
dc.subjectMÜHENDİSLİK, BİYOMEDİKSEL
dc.titleEEG-based index for engagement level monitoring during sustained attention
dc.typeBildiri
dc.contributor.departmentPolytechnic University of Milan , ,
dc.contributor.firstauthorID3382790


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