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dc.contributor.authorDeger, Deniz
dc.contributor.authorUlutas, K.
dc.contributor.authorSkarlatos, Y.
dc.date.accessioned2021-03-03T09:19:16Z
dc.date.available2021-03-03T09:19:16Z
dc.date.issued2006
dc.identifier.citationUlutas K., Deger D., Skarlatos Y., "Thickness dependence of optical properties of amorphous indium oxide thin films deposited by reactive evaporation", PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, cilt.203, sa.10, ss.2432-2437, 2006
dc.identifier.issn1862-6300
dc.identifier.otherav_1c5f2562-2ab2-40b6-a3ee-5b7be94197a0
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/24319
dc.identifier.urihttps://doi.org/10.1002/pssa.200521321
dc.description.abstractThe electrical conductivity and absorption coefficient of amorphous indium oxide thin films, thermally evaporated on glass substrates at room temperature, were evaluated. For direct transitions the variation of the optical band gap with thickness was determined and this variation was supposed to appear due to the variation of localized gap states, whereas the variation of conductivity with thickness was supposed to be due to the variation of carrier concentration. We attribute the variation of absorption coefficient with thickness to the variation of optical band gap energy rather than optical interference. (c) 2006 WILEYNCH Verlag GmbH & Co. KGaA, Weinheim.
dc.language.isoeng
dc.subjectMühendislik ve Teknoloji
dc.subjectMALZEME BİLİMİ, MULTIDISCIPLINARY
dc.subjectMalzeme Bilimi
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectFİZİK, UYGULAMALI
dc.subjectFizik
dc.subjectTemel Bilimler (SCI)
dc.subjectFİZİK, YOĞUN MADDE
dc.subjectYoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler
dc.subjectTemel Bilimler
dc.titleThickness dependence of optical properties of amorphous indium oxide thin films deposited by reactive evaporation
dc.typeMakale
dc.relation.journalPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
dc.contributor.department, ,
dc.identifier.volume203
dc.identifier.issue10
dc.identifier.startpage2432
dc.identifier.endpage2437
dc.contributor.firstauthorID179435


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