The study on characterization of sputtered-GZO thin films with different RF power

dc.contributor.author	BOYALI, Emine
dc.contributor.author	KINACI, Barış
dc.contributor.author	ÖZÇELİK, Süleyman
dc.contributor.author	Akın, Nihan
dc.contributor.author	Cömert, Buse
dc.contributor.author	Dönmez, Meltem
dc.contributor.author	ÖZEN, Yunus
dc.date.accessioned	2021-03-03T14:06:53Z
dc.date.available	2021-03-03T14:06:53Z
dc.identifier.citation	Akın N., Cömert B., Dönmez M., ÖZEN Y., BOYALI E., KINACI B., ÖZÇELİK S., "The study on characterization of sputtered-GZO thin films with different RF power", 11th Nanoscience and Nanotechnology Conference, Ankara, Türkiye, 22 - 25 Haziran 2015, ss.15
dc.identifier.other	av_37d03e9d-c7c7-4f62-a831-475ae8708ae4
dc.identifier.other	vv_1032021
dc.identifier.uri	http://hdl.handle.net/20.500.12627/41626
dc.language.iso	eng
dc.subject	Temel Bilimler (SCI)
dc.subject	Fizik
dc.subject	Temel Bilimler
dc.title	The study on characterization of sputtered-GZO thin films with different RF power
dc.type	Bildiri
dc.contributor.department	Gazi Üniversitesi , ,
dc.contributor.firstauthorID	449459

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