In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures
Author
ADNANE, LHACENE
SILVA, HELENA
GOKIRMAK, ALI
LAM, C. H.
ZHU, YU
DIRISAGLIK, FARUK
Woods, Zachary
CYWAR, ADAM
ÇİL, Kadir
Metadata
Show full item recordCollections
- Bildiri [64839]