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dc.contributor.authorBasar, Gu
dc.contributor.authorBingol, D.
dc.contributor.authorKroeger, S.
dc.contributor.authorBasar, Go.
dc.contributor.authorEr, Alev
dc.contributor.authorGuzelcimen, Feyza
dc.contributor.authorOzturk, I. K.
dc.date.accessioned2021-03-04T09:30:55Z
dc.date.available2021-03-04T09:30:55Z
dc.identifier.citationBasar G., Guzelcimen F., Ozturk I. K. , Er A., Bingol D., Kroeger S., Basar G., "Hyperfine structure measurements of neutral vanadium by laser-induced fluorescence spectroscopy in the wavelength range from 750 nm to 860 nm", JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER, cilt.202, ss.193-199, 2017
dc.identifier.issn0022-4073
dc.identifier.otherav_68abd781-afcd-4ee8-8f7a-2de85f45e8ec
dc.identifier.othervv_1032021
dc.identifier.urihttp://hdl.handle.net/20.500.12627/72530
dc.identifier.urihttps://doi.org/10.1016/j.jqsrt.2017.07.035
dc.description.abstractThe hyperfine structure of 57 spectral lines of neutral vanadium has been investigated using a hollow cathode lamp by laser-induced fluorescence spectroscopy in the wavelength range from 750 nm to 860 nm. New magnetic dipole hyperfine structure constants A have been determined for 14 atomic energy levels and new electric quadrupole hyperfine structure constants B for two levels. Additionally previously published hyperfine structure constants A of 56 levels have been measured again. In five cases, the old A values have been rejected and replaced by improved values. (C) 2017 Elsevier Ltd. All rights reserved.
dc.language.isoeng
dc.subjectTemel Bilimler (SCI)
dc.subjectFizik
dc.subjectSPEKTROSKOPİ
dc.subjectKimya
dc.subjectElektromanyetizma, Akustik, Isı Transferi, Klasik Mekanik ve Akışkanlar Dinamiği
dc.subjectOptik
dc.subjectFizikokimya
dc.subjectTemel Bilimler
dc.subjectSpektroskopi
dc.subjectOPTİK
dc.titleHyperfine structure measurements of neutral vanadium by laser-induced fluorescence spectroscopy in the wavelength range from 750 nm to 860 nm
dc.typeMakale
dc.relation.journalJOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER
dc.contributor.departmentİstanbul Teknik Üniversitesi , ,
dc.identifier.volume202
dc.identifier.startpage193
dc.identifier.endpage199
dc.contributor.firstauthorID247326


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