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Thickness dependence of optical properties of amorphous Indium Oxide Thin Films deposited by reactive evaporation

dc.contributor.authorDeğer , Denız
dc.contributor.authorUlutaş, Hulusı Kemal
dc.date.accessioned2021-03-04T10:37:33Z
dc.date.available2021-03-04T10:37:33Z
dc.identifier.citationUlutaş H. K. , Değer D., "Thickness dependence of optical properties of amorphous Indium Oxide Thin Films deposited by reactive evaporation", 21st General Conference of Condensed Matter Division, Dresden, Almanya, 1 - 04 Mart 2006, ss.10
dc.identifier.othervv_1032021
dc.identifier.otherav_6e288737-d99e-49c7-aa43-4550736b016b
dc.identifier.urihttp://hdl.handle.net/20.500.12627/76061
dc.language.isoeng
dc.subjectMalzeme Bilimi
dc.subjectMetalurji ve Malzeme Mühendisliği
dc.subjectMühendislik ve Teknoloji
dc.subjectMühendislik, Bilişim ve Teknoloji (ENG)
dc.subjectMETALURJİ VE METALURJİ MÜHENDİSLİĞİ
dc.titleThickness dependence of optical properties of amorphous Indium Oxide Thin Films deposited by reactive evaporation
dc.typeBildiri
dc.contributor.departmentİstanbul Üniversitesi , Fen Fakültesi , Fizik
dc.contributor.firstauthorID732705


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